ECE484 Radhard Circuit Design

• Introduction to the design of integrated circuits for use in ionizing environments.
• Interaction of electronic silicon structures with ionizing radiation and TCAD tools for the analysis of the phenomenon.
• Single Event Upsets (SEU) modeling methods in integrated circuits.
• Logic, timing, electrical masking.
• Multiple Event Upsets and sub-10nm circuits.
• Soft Error Rate (SER) and its calculation methods.
• Advanced simulation methods.
• Circuit techniques for reducing SER.
• Presentation and analysis of real cases.
• Overview of modern research directions.
• Lab: Simulation of a complete circuit without radiation, with radiation and after interventions for reliable operation in ionizing environments.

The course includes the techniques required for the reliable design of radiation hardened integrated circuits for use in ionizing environments such as in areas with radiation or space.
Upon successful completion of the course the student will be able to:

• Understand the basic definitions and specialized issues related to the problems and techniques of designing integrated circuits for use in ionizing environments.
• Have specialized knowledge in advanced topics found in the modern integrated circuit manufacturing industry.
• Explain and solve problems related to the structure, identification and treatment of issues of proper operation under radiation in modern integrated circuits, or comment on issues from important publications in the field.
• Implement design strategies in conjunction with existing integrated circuit implementation methods and related EDA tools.
• Collaborate with his colleagues to create and present a group project on a topic related to the design and implementation of a radiant integrated tolerance, if he chooses a team project.
• Seek and study contemporary literature in internationally recognized journals and conferences, explain and evaluate satisfactorily publications from them, as well as present conclusions to the class, if he/she chooses individual work.